Indian Journal of Science and Technology
DOI: 10.17485/ijst/2013/v6isp5.17
Year: 2013, Volume: 6, Issue: Supplementary 5, Pages: 1-5
Original Article
B. Karthik1 * and T. V. U. Kiran Kumar2
1 Assistant Professor, ECE Department, [email protected]
2 Professor, ECE Department, Bharath University, [email protected]
*Author for Correspondence
B. Karthik
Assistant Professor, ECE Department,
Email: [email protected]
In addition to the functional aspects, Electromagnetic Compatibility (EMC) compliance of electronic devices is one of the important challenges that the developers encounter before the product release. Limiting the EM noise, both conducted and radiated is one of the main requirements to achieve this compliance. The methods defined in the traditional standards have got many shortcomings. Measurement of noise of short duration is an example. Some noises like the transients from a switching device also defeat the traditional measurement procedures. Conventional methods don’t prove to be efficient for the measurement of such noises since it is difficult to capture the noise level for the whole frequency range within short duration using a single test receiver. In this paper, we have developed methods that can efficiently measure the short duration noise types mentioned above.
Keywords: EMC, EMI, Radiated, Emission, Short-Duration.
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