• P-ISSN 0974-6846 E-ISSN 0974-5645

Indian Journal of Science and Technology


Indian Journal of Science and Technology

Year: 2013, Volume: 6, Issue: Supplementary 5, Pages: 1-5

Original Article

EMI Developed Test Methodologies for Short Duration Noises


In addition to the functional aspects, Electromagnetic Compatibility (EMC) compliance of electronic devices is one of the important challenges that the developers encounter before the product release. Limiting the EM noise, both conducted and radiated is one of the main requirements to achieve this compliance. The methods defined in the traditional standards have got many shortcomings. Measurement of noise of short duration is an example. Some noises like the transients from a switching device also defeat the traditional measurement procedures. Conventional methods don’t prove to be efficient for the measurement of such noises since it is difficult to capture the noise level for the whole frequency range within short duration using a single test receiver. In this paper, we have developed methods that can efficiently measure the short duration noise types mentioned above.
Keywords: EMC, EMI, Radiated, Emission, Short-Duration.


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