Indian Journal of Science and Technology
DOI: 10.17485/ijst/2016/v9iS1/106845
Year: 2016, Volume: 9, Issue: Special Issue 1, Pages: 1-5
Original Article
Md. Ashikuzzaman* and Asif Iqbal
Department of Electrical and Electronic Engineering, Daffodil International University102 Mirpur Road, Dhaka 1207, Bangladesh; [email protected]
[email protected]
*Author for correspondence
Ashikuzzaman
Department of Electrical and Electronic Engineering
Email:[email protected]
Objective: In this Paper, a simplified mathematical model for Modulation Transfer Function (MTF) of Polycrystalline Mercuric Iodide based flat panel x-ray detector is applied on three different published prototypes of Polycrystalline Mercuric Iodide. Our aim was to fit the curves generated by simulation of MTF model with the curves acquired from experimental data. Method: Varied Electric field was employed to obtain the best fitting. Findings: The mobility-lifetime product for the best curve fitting was examined for each prototype. Percentage of fitting error has been estimated for each prototype. Finally, average absolute error has been calculated for all the incorporated prototypes. Application: This study can be further extended to develop a generic empirical model for the Modulation Transfer Function of polycrystalline mercuric iodide based flat panel x-ray detectors.
Keywords: Average Absolute Error, Electric Field Intensity, Empirical Model, Error Analysis, Mobility-Lifetime Product, Modulation Transfer Function
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