Modified Block Based Technique for Efficient Test Data Compression

S  Saravanan   and S  Sharmila

doi:10.17485/ijst/2016/v9i48/61857

Article

Modified Block Based Technique for Efficient Test Data Compression

VIEWS 737
PDF 189

Abstract
Full-Text HTML
Full-Text PDF
How to Cite

Indian Journal of Science and Technology

DOI: 10.17485/ijst/2016/v9i48/61857

Year: 2016, Volume: 11, Issue: 48, Pages: 1-5

Original Article

Modified Block Based Technique for Efficient Test Data Compression

S. Saravanan^1* and S. Sharmila²

¹ School of Computing, SASTRA UNIVERSITY, Tirumalaisamudram, Thanjavur - 613401, Tamilnadu, India; [email protected]
² Deaprtment of Master in Technology, VLSI Design, SASTRA University, Tirumalaisamudram, Thanjavur - 613402, Tamilnadu, India; [email protected]

This work is licensed under a Creative Commons Attribution 4.0 International License.

Abstract

Test data compression is one of the major challenging tasks in VLSI. This paper targets on Test Data compression by using block based method without any variation in the system performance. Test data sets are separated into five kinds of blocks like whole zeros, whole ones, min zero/min one, max ones and complement blocks. The blocks will be read based on the presence of 0s and 1s. The analysis made in the ISCAS89 benchmark circuit shows that the proposed method is more efficient and more flexible and produces a good compression ratio when compared to the existing methods.

Keywords: Data Compression, Code Based Compression, Min Zero - Min One Test Pattern, Test Patterns