Indian Journal of Science and Technology
DOI: 10.17485/ijst/2014/v7i11.19
Year: 2014, Volume: 7, Issue: 11, Pages: 1765–1773
Original Article
H. Dibachi1*, M. H. Behzadi1 and M. Izadikhah2
1 Department of Statistics, Science and Research Branch, Islamic Azad University, Tehran, Iran; h-dibachi@iau-arak.ac.ir, behzadi@srbiau.ac.ir
2 Department of Mathematics, Arak-Branch, Islamic Azad University, Arak, Iran; m-izadikhah@iau-arak.ac.ir
One class of models introduced in data envelopment analysis is called multiplicative model. In this paper, the extension of multiplicative data envelopment analysis(MDEA) model under variable return to scale(VRS) technology in the presence of stochastic data was focused on. The log-normal distribution is a family of probability density functions that is frequently used in practical situations. Therefore, in the present study, a stochastic MDEA model under VRS technology was proposed for measuring the stochastic a - efficiency of decision making units (DMUs) with inputs and outputs having log-normal distributions. Moreover, stochastic super-efficiency model was proposed for ranking stochastic a - efficient DMUs in stochastic MDEA model. Finally, an example of the system reliability was presented for 12 different brands of computers to demonstrate our proposed modeling idea and its efficiency.
Keywords: Log-normal Distribution, Multiplicative Data Envelopment Analysis(MDEA), Stochastic MDEA, Stochastic a - efficiency, Stochastic Super-efficiency, System Reliability
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