Indian Journal of Science and Technology
Year: 2022, Volume: 15, Issue: 33, Pages: 1605-1612
Chitta Lakshmipathi1*, Borra Rajesh Kumar2, Kande Sreelekha3, Thota Subba Rao1
1Department of Physics, Sri Krishnadevaraya University, Anantapur, 515003, Andhra Pradesh, India
2Department of Physics, GITAM (Deemed to be University), Visakhapatnam, 530045, Andhra Pradesh, India
3Department of Physics, Government Degree College (Autonomous), Anantapur, 515001, Andhra Pradesh, India
Email: [email protected]
Received Date:28 February 2022, Accepted Date:10 July 2022, Published Date:26 August 2022
Objectives: 1. To prepare SrBi4Ti4O15 ceramics via solid-state reaction method. 2. To make a systematic investigations on structural and dielectric properties of SBT ceramics. Methods: The structural information of Strontium Bismuth Titanate (SBT) ceramics is examined by X-ray diffraction and Raman spectroscopy techniques. The surface morphology and elemental analysis of SBT ceramic is employed by scanning electron microscope attached with energydispersive X-ray spectroscopy. The dielectric measurements of SBT ceramics were performed using the impedance analyzer HIOKI-3532 LCR meter. Findings: From the X-ray diffraction studies, SBT exhibits a strongest diffraction peak (1 1 9) with the lattice parameters a = 5.428 Å, b = 5.423 Å, and c = 42.146 Å. The diffraction patterns were indexed to the orthorhombic phase. The surface morphology of the samples shows plate-like morphology with a grain size of ~1mm. The temperature-dependent ac conductivity confirms the thermally activated conduction mechanism. The ac conductivity of SBT ceramic was increased from 2.25 10-5 to 7.16 10-4 Ω.m-1 with an increase of frequency from 10 kHz to 1 MHz. The high curie temperature at ~540 ◦C, and low dielectric loss of ~0.031 for SBT ceramics can be appropriate for high-temperature electronic applications. Novelty: SBT ceramic exhibits enhanced electrical conductivity value (7.16 10-4 Ω.m-1)and makes it suitable for electronic device applications.
Keywords: Scanning electron microscope; Dielectric constant; Dielectric loss; Conduction mechanism 1; X-ray diffraction
© 2022 Lakshmipathi et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
Published By Indian Society for Education and Environment (iSee)
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