The Effect from Finite DC Gain and Gain-Bandwidth of an Op-amp on Pipelined Analog-to-Digital Converter Errors

Alexander Korotkov and Ivan Piatak

doi:10.17485/ijst/2016/v9i2/72205

Article

The Effect from Finite DC Gain and Gain-Bandwidth of an Op-amp on Pipelined Analog-to-Digital Converter Errors

VIEWS 845
PDF 435

Abstract
Full-Text HTML
Full-Text PDF
How to Cite

Indian Journal of Science and Technology

DOI: 10.17485/ijst/2016/v9i2/72205

Year: 2016, Volume: 9, Issue: 4, Pages: 1-4

Original Article

The Effect from Finite DC Gain and Gain-Bandwidth of an Op-amp on Pipelined Analog-to-Digital Converter Errors

Alexander Korotkov and Ivan Piatak^*

Department of the Integrated Electronics, Peter the Great St. Petersburg Polytechnic University, Russia; i.m.piatak@ gmail.com, [email protected]

*Author For Correspondence
Ivan Piatak Department of the Integrated Electronics, Peter the Great St. Petersburg Polytechnic University, Russia; i.m.piatak@ gmail.com

This work is licensed under a Creative Commons Attribution 4.0 International License.

Abstract

Pipelined ADCs with digital error correction and double-sampling are demand gain error of the stage calculations at given parameters of the op-amp of the stages. In contrast to known approaches to the analysis of the 1.5-bit conversion stage, results within the z-domain with account for both the finite GB and DC gain are discussed. This analysis allows us to more accurately take into account GB and DC gain dependencies versus ADC resolution and sampling rate for both conventional and double-sampling stages of the pipeline.

Keywords: 1.5-Bit Stage, Digital Error Calibration, Gain Error, Pipelined ADC, Switched-Capacitor Circuits (SC-circuits)