Indian Journal of Science and Technology
DOI: 10.17485/ijst/2011/v4i4.3
Year: 2011, Volume: 4, Issue: 4, Pages: 440-442
Original Article
Shyam Akashe1* , Deepak Kumar Sinha2 and Sanjay Sharma1
1 Dept. of Electronics and Communication Engineering, Thapar University, Patiala, India
2 Dept. of Electronics and Communication Engineering, Institute of Technology and Management,
[email protected]; [email protected]; [email protected]
A low leakage power, 45-nm 1Kb SRAM was fabricated. The stand-by leakage power of a 1K-bit memory cell array incorporating a newly-developed leakage current reduction circuit called a self-controllable voltage level (SVL) circuit was only 3.7 nW, which is 5.4% that of an equivalent conventional memory-cell array at a VDD of 1.8V. On the other hand, the speed remained almost constant with a minimal overhead in terms of the memory cell array area.
Keywords: SRAM, memory cell array, leakage current.
Subscribe now for latest articles and news.