Indian Journal of Science and Technology
DOI: 10.17485/ijst/2016/v9i44/99517
Year: 2016, Volume: 9, Issue: 44, Pages: 1-6
Original Article
Vikash Kumar*, Manish Kumar Pandey, Shashank Kumar Ranu, Prashant Gupta and Aminul Islam
Department of Electronics and Communication Engineering, Birla Institute of Technology (Deemed University), Mesra, Ranchi, Jharkhand, India; [email protected], [email protected], [email protected], [email protected], [email protected]
*Author for correspondence
Vikash Kumar
Department of Electronics and Communication Engineering, Birla Institute of Technology (Deemed University), Mesra, Ranchi, Jharkhand, India; [email protected]
Objective: The aim of this work is to design a robust and reliable XOR circuit for ultra-low power operation in sub-threshold region. Method/Analysis: Comprehensive simulations have been carried out on SPICE using 16-nm predictive technology model (PTM) to accomplish our objective. Findings: A Schmitt-trigger based approach is employed to alleviate the effect of device threshold (Vt )fluctuation on XOR circuits. The proposed XOR circuit exhibits narrower spread in its design metrics proving its reliability in sub-45nm regime. Novelty/Improvement: This paper also analyzes various existing XOR gates in presence of process and environment (voltage and temperature)fluctuations to validate their performance. The proposed technique offers full voltage swing. Variability of the design metrics (propagation delay and power dissipation) is investigated and several XOR circuits are compared. The proposed Schmitt-trigger based XOR circuit exhibits narrower spread in its design metrics proving its reliability in sub-45nm regime.
Keywords: Full Voltage Swing, Propagation Delay, Power, Variability, XOR
Subscribe now for latest articles and news.
