Indian Journal of Science and Technology
DOI: 10.17485/ijst/2018/v11i45/138545
Year: 2018, Volume: 11, Issue: 45, Pages: 1-9
Original Article
Pheng Hak Tan1 , Ming Ha Lee1 * and M. L. Dennis Wong2
1 Faculty of Engineering, Computing and Science, Swinburne University of Technology Sarawak Campus, Kuching, Sarawak, Malaysia; [email protected]
2 Institute of Sensors, Signals and Systems, School of Engineering and Physical Sciences, Heriot-Watt University Malaysia, Putrajaya, Selangor, Malaysia
*Author for correspondence
Ming Ha Lee,
Faculty of Engineering, Computing and Science, Swinburne University of Technology Sarawak Campus, Kuching, Sarawak, Malaysia; [email protected]
Objectives: In this study, the economic-statistical design of the synthetic X chart is developed for monitoring the non-normal process data. Methods/Analysis: The Burr distribution is employed as a general model of the process distribution. In this economic-statistical model, the optimal design parameters of the synthetic X chart are determined, such that the cost function is minimized, for the given values of the cost and process parameters. An example is presented to illustrate the solution procedure of the economic-statistical design for the synthetic X chart under non-normality. Findings: A sensitivity analysis on the cost and process parameters is presented. The results of the sensitivity analysis conclude that a cost cost can be reduced by decreasing one of the values in λ, C0 , C1 , Y, W, b, c, e and T1 or by increasing one of the values in δ and T2 . In comparison with the variable parameters X chart, the synthetic X chart has better economic performance. Novelty/Improvement: To investigate the economic and statistical performances of the synthetic X chart when the measurements are not normally distributed.
Keywords: Burr Distribution, Economic-statistical Design, Non-normality, Process Mean, Synthetic Chart
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