Indian Journal of Science and Technology

Abstract

Nowadays, particle characterization such as size, count and shape, has been widely used in industrial processes to provide better understanding on their products. An optical tomography system has proven to be a useful approach in characterizing particles due to its ability to determine the content of a closed system without any physical contact. Thus, this paper presents the use of Complementary Metal Oxide Semiconductor linear image sensor in the development of optical tomography system, where the system is used for solid particle characterization. The developed system used the CMOS S10077 Linear Image Sensor as the optical detector, and Arduino Nano microcontroller to control the sensor’s operation and to provide a data acquisition system for the CMOS S10077. The Data Display Serial Port application is used to display data from the sensor in a numeric array to allow pattern plotting of its result. Particle characterization experiments based on count is conducted after the completion of the hardware and software setup. The experimental results are collected and analyzed. The verification of the experimental and actual results is determined based on the analysis of the particle counts.
Keywords: CMOS, Hardware, Microcontroller, Tomography