Indian Journal of Science and Technology
DOI: 10.17485/ijst/2016/v9i44/105277
Year: 2016, Volume: 9, Issue: 44, Pages: 1-6
Original Article
Swapnil Sourav* and Aminul Islam
Department of Electronics and Communication Engineering, Birla Institute of Technology (Deemed University), Mesra, Ranchi, Jharkhand – 835215, India; [email protected], [email protected]
*Author for correspondence
Swapnil Sourav
Department of Electronics and Communication Engineering, Birla Institute of Technology (Deemed University), Mesra, Ranchi, Jharkhand – 835215, India; [email protected]
Objectives: This paper carries out robustness study on p-channel and n-channel input differential amplifier (which is also known as single-stage operational transconductance amplifier). Methods and Analysis: The impact of Process, Voltage and Temperature (PVT) variations on the design metrics of both differential amplifiers is studied and suitable conclusions are drawn. Findings: The n-channel input differential amplifier is found to be more robust than p-channel input differential amplifier. Moreover, it provides higher gain, and 3-dB bandwidth as compared to its p-channel counterpart. All the results were obtained from extensive simulation using Virtuoso Analog Design Environment of Cadence @ 45-nm technology node. Application: Operational Transconductance Amplifier (OTA) can be used in the design of simple amplifiers with voltage-controllable gain and to the design of first-order and second-order active filters with controllable gains and controllable critical frequencies.
Keywords: Differential Amplifier, PVT Variation, Robustness, Single-stage OTA
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